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HZ-17 EMC Near-Field Probes

    產品簡述
    ♦ 頻寬: 30 MHz to 3 GHz
    ♦ compact H near-field probe set
      詢價

      產品詳細介紹Product Introduction

      EMC NEAR-FIELD PROBES
      Powerful E and H near-field probes for the frequency range from 30 MHz to 3 GHz with optional preamplifier expand the application range of the R&S®RTO oscilloscopes to include EMI debugging.

      R&S®RTO oscilloscope's powerful FFT analysis function
      The R&S®RTO oscilloscope's powerful FFT function permits for the first time debugging of EMI problems using an oscilloscope. Developers now have a cost-effective solution for EMI debugging right on their lab bench. Unwanted EMI can be displayed simultaneously in both the time and frequency domain, speeding up debugging.

      Versatile near-field probe sets
      Near-field probes are used to analyze EMC problems in electronic circuits and to identify their causes. Rohde&Schwarz offers several near-field probe sets that include E-field and H-field probes for use with oscilloscopes, signal and spectrum analyzers and EMI test receivers.

      The R&S®HZ-15 E and H near-field probe set consists of several passive near-field probes that are ideal for diagnosing EMC problems on printed boards. The compact design facilitates localization of EMI sources down to the individual conductors. The optional R&S®HZ-16 preamplifier offers 20 dB gain for greater sensitivity in the frequency range from 100 kHz to 3 GHz.

      The R&S®HZ-17 H field probe set is an economic near-field probe set for EMI debugging when E field measurements are not required.



      ModelFrequency rangeComment
      Near-field probe
      R&S®HZ-15 30 MHz to 3 GHz compact E and H near-field probe set
      R&S®HZ-17 30 MHz to 3 GHz compact H near-field probe set
      Accessoies
      R&S®HZ-16 100 kHz to 3 GHz preamplifier 3 GHz, 20 dB, power adapter 100 V to 230 V
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