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EMC近場探棒
HZ-17 EMC Near-Field Probes
產品簡述
♦ 頻寬: 30 MHz to 3 GHz
♦ compact H near-field probe set
詢價
產品詳細介紹
Product Introduction
EMC NEAR-FIELD PROBES
Powerful E and H near-field probes for the frequency range from 30 MHz to 3 GHz with optional preamplifier expand the application range of the R&S®RTO oscilloscopes to include EMI debugging.
R&S®RTO oscilloscope's powerful FFT analysis function
The R&S®RTO oscilloscope's powerful FFT function permits for the first time debugging of EMI problems using an oscilloscope. Developers now have a cost-effective solution for EMI debugging right on their lab bench. Unwanted EMI can be displayed simultaneously in both the time and frequency domain, speeding up debugging.
Versatile near-field probe sets
Near-field probes are used to analyze EMC problems in electronic circuits and to identify their causes. Rohde&Schwarz offers several near-field probe sets that include E-field and H-field probes for use with oscilloscopes, signal and spectrum analyzers and EMI test receivers.
The R&S®HZ-15 E and H near-field probe set consists of several passive near-field probes that are ideal for diagnosing EMC problems on printed boards. The compact design facilitates localization of EMI sources down to the individual conductors. The optional R&S®HZ-16 preamplifier offers 20 dB gain for greater sensitivity in the frequency range from 100 kHz to 3 GHz.
The R&S®HZ-17 H field probe set is an economic near-field probe set for EMI debugging when E field measurements are not required.
Model
Frequency range
Comment
Near-field probe
R&S®HZ-15
30 MHz to 3 GHz
compact E and H near-field probe set
R&S®HZ-17
30 MHz to 3 GHz
compact H near-field probe set
Accessoies
R&S®HZ-16
100 kHz to 3 GHz
preamplifier 3 GHz, 20 dB, power adapter 100 V to 230 V
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